Article on design and operation of an ytterbium ion trap experiment with a setup that can host advanced surface and multilayer ion trap chips. We make a heating rate measurement and provide transition frequency measurements more precise than previously published work, published in Phys. Rev. A (21 Jan. 2011)
Article on Dopper-free Yb spectroscopy of Yb using a fluorescence spot technique providing frequency measurements that differ from previous published work and allowing to determine the average velocity of atoms along an atomic beam, published in Phys. Rev. A (8 Oct. 2010)
Manuscript: Doppler-free Yb Spectroscopy with Fluorescence Spot Technique
Single ytterbium ions are trapped in an experimental setup particularly designed for the development of advanced ion trap chips. This setup allows for rapid turn-around time, optical access for all type of ion trap chips and up to 100 electric interconnects. The particular ion trap used features an ion – electrode distance of 300 microns and we observed an ion life time of more than 1 hour.
Article on the transport of ions in large scale multi-dimensional ion trap arrays is published in “Quantum Information & Computation”.
Manuscript: On the Transport of Atomic Ions in Linear and Multidimensional Ion Trap Arrays.
September 06
Measurement of motional decoherence scaling for an ion trap with moveable electrodes, demonstrated significant suppression of patch potential heating, demonstrated ion trap with 23 microns ion-electrode spacing in experiments at the University of Michigan published in Physical Review Letters.
Efficient photoionization of neutral atoms with pico- and nanosecond pulses for loading ion traps.
Experiments carried out at the University of Michigan reporting first two-dimensional shuttling operations including corner-turning and swapping two ions inside a T-junction published in Applied Physics Letters.
Integrated ion chip experiments at the University of Michigan published in Nature Physics.
